A recent trend towards integrating FPGAs with many heterogeneous components, such as memory systems, dedicated multipliers, etc., has made them an attractive option for implementin...
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
The specification of schema mappings has proved to be time and resource consuming, and has been recognized as a critical bottleneck to the large scale deployment of data integrati...
Khalid Belhajjame, Norman W. Paton, Suzanne M. Emb...
By functionally decomposing a specific algorithm (the hierarchical secure aggregation algorithm of Chan et al. [3] and Frikken et al. [7]), we uncover a useful general functionali...
The requirements for secure document workflows in enterprises become increasingly sophisticated, with employees performing different tasks under different roles using the same pro...
Yacine Gasmi, Ahmad-Reza Sadeghi, Patrick Stewin, ...