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» On Testing Answer-Set Programs
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IFIP
2001
Springer
15 years 11 months ago
Random Adjacent Sequences: An Efficient Solution for Logic BIST
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
René David, Patrick Girard, Christian Landr...
APLAS
2008
ACM
15 years 8 months ago
The Complexity of Coverage
Abstract. We study the problem of generating a test sequence that achieves maximal coverage for a reactive system under test. We formulate the problem as a repeated game between th...
Krishnendu Chatterjee, Luca de Alfaro, Rupak Majum...
ECLIPSE
2005
ACM
15 years 8 months ago
IDE Support for test-driven development and automated grading in both Java and C++
Students need to learn testing skills, and using test-driven development on assignments is one way to help students learn. We use a flexible automated grading system called Web-CA...
Anthony Allowatt, Stephen Edwards
POPL
2009
ACM
16 years 7 months ago
Automatic modular abstractions for linear constraints
c Modular Abstractions for Linear Constraints David Monniaux VERIMAG June 27, 2008 se a method for automatically generating abstract transformers for static by abstract interpreta...
David Monniaux
ICFP
2002
ACM
16 years 6 months ago
A demand-driven adaptive type analysis
Compilers for dynamically and statically typed languages ensure safe execution by verifying that all operations are performed on appropriate values. An operation as simple as car ...
Danny Dubé, Marc Feeley