— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
Consider a scenario where a distributed signal is sparse and is acquired by various sensors that see different versions. Thus, we have a set of sparse signals with both some commo...
In this work, we present a genetic algorithm based automated circuit synthesis framework for passive analog circuits. A procedure is developed for the simultaneous generation of b...
— In this paper, a parallel model of multi-objective genetic algorithm supposing a grid environment is discussed. In this proposed parallel model, we extended master-slave model ...
— This paper presents a multiple-voltage high-level synthesis methodology for low power DSP applications using algorithmic transformation techniques. Our approach is motivated by...