8728 search results - page 193 / 1746 » On Reduct Construction Algorithms |
170
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DAC
2003
ACM
16 years 7 months ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
194
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
: Due to exponential increase in subthreshold leakage with technology scaling and temperature increase, leakage power is becoming a major fraction of total power in the active mode...
159
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
Increasing source voltage (Source-Biasing) is an efficient technique for reducing gate and sub-threshold leakage of SRAM arrays. However, due to process variation, a higher source...
160
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ISBI
2008
IEEE
16 years 7 months ago
2008
IEEE
We describe a new approach for elucidating the nonlinear degrees of freedom in a distribution of shapes depicted in digital images. By combining a deformation-based method for mea...
168
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Accurate estimation of worst-case crosstalk effects is critical for a realistic estimation of the worst-case behavior of deep sub-micron circuits. Crosstalk analysis models usu...