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DATE
2005
IEEE
115views Hardware» more  DATE 2005»
16 years 6 days ago
Stochastic Power Grid Analysis Considering Process Variations
In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid’s...
Praveen Ghanta, Sarma B. K. Vrudhula, Rajendran Pa...
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
16 years 6 days ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
ICCV
2005
IEEE
16 years 5 days ago
On the Spatial Statistics of Optical Flow
We develop a method for learning the spatial statistics of optical flow fields from a novel training database. Training flow fields are constructed using range images of natur...
Stefan Roth, Michael J. Black
ICMCS
2005
IEEE
145views Multimedia» more  ICMCS 2005»
16 years 5 days ago
Error Resilient Multiple Description Coding Based on Wavelet Tree Coding and EREC for Wireless Networks
In this paper, we propose an integrated error resilient MDC scheme for wireless networks with both packet loss and random bit errors. Two descriptions are first generated independ...
Daewon Song, Lei Cao, Chang Wen Chen
ISCAS
2005
IEEE
133views Hardware» more  ISCAS 2005»
16 years 5 days ago
Multiobjective VLSI cell placement using distributed simulated evolution algorithm
— Simulated Evolution (SimE) is a sound stochastic approximation algorithm based on the principles of adaptation. If properly engineered it is possible for SimE to reach nearopti...
Sadiq M. Sait, Ali Mustafa Zaidi, Mustafa I. Ali