4451 search results - page 447 / 891 » On Random Ordering Constraints |
177
Voted
VTS
1997
IEEE
15 years 11 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
168
Voted
ICCAD
1996
IEEE
15 years 11 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...
178
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ISTCS
1993
Springer
15 years 11 months ago
1993
Springer
d Abstract) David P. Anderson Nimrod Megiddoy Moni Naorz April 1993 The \Minimum Reservation Rate Problem" arises in distributed systems for handling digital audio and video d...
171
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CEC
2007
IEEE
15 years 11 months ago
2007
IEEE
In this paper, we present a model for simulating the evolution of development together with a method for the analysis of emergence of negative feedback inside the regulatory networ...
205
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ICCTA
2007
IEEE
15 years 10 months ago
2007
IEEE
We have carried out experimental research into implicit representation of large graphs using reduced ordered binary decision diagrams (OBDDs). We experimentally show that for grap...