Sciweavers

4451 search results - page 365 / 891
» On Random Ordering Constraints
Sort
View
ISVLSI
2003
IEEE
157views VLSI» more  ISVLSI 2003»
16 years 1 days ago
Joint Minimization of Power and Area in Scan Testing by Scan Cell Reordering
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...
Shalini Ghosh, Sugato Basu, Nur A. Touba
VTS
2003
IEEE
127views Hardware» more  VTS 2003»
16 years 1 days ago
Bist Reseeding with very few Seeds
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McC...
GLOBECOM
2009
IEEE
15 years 10 months ago
Adding Integrity Verification Capabilities to the LDPC-Staircase Erasure Correction Codes
File distribution is becoming a key technology, in particular in large scale content broadcasting systems like DVBH/SH. They largely rely on Application Level FEC codes (ALFEC) in ...
Mathieu Cunche, Vincent Roca
APNOMS
2006
Springer
15 years 10 months ago
Network-Adaptive QoS Routing Using Local Information
In this paper, we propose the localized adaptive QoS routing scheme using POMDP(partially observable Markov Decision Processes) and Exploration Bonus. In order to deal with POMDP p...
Jeongsoo Han
DCC
2010
IEEE
15 years 10 months ago
On the Adaptive Coefficient Scanning of JPEG XR/HD Photo
We explore several local and global strategies for adaptive scan ordering of transform coefficients in JPEG XR/HD Photo. This codec applies a global adaptive scan-order heuristic ...
Vanessa Testoni, Max H. M. Costa, Darko Kirovski, ...