Unsupervised clustering can be significantly improved using supervision in the form of pairwise constraints, i.e., pairs of instances labeled as belonging to same or different clu...
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
Abstract. In this paper, we introduce a Yet ImprovEd Limited Discrepancy Search (YIELDS), a complete algorithm for solving Constraint Satisfaction Problems. As indicated in its nam...
The management of business processes has recently received a lot of attention. One of the most interesting problems is the description of a process model in a language that allows ...
Process variation has become a major concern in the design of many nanometer circuits, including interconnect pipelines. This paper develops closed-form models to predict the dela...