10539 search results - page 1863 / 2108 » On L |
166
click to vote
VLSID
2005
IEEE
16 years 7 months ago
2005
IEEE
Modern digital circuits consist of logic gates implemented in the complementary metal oxide semiconductor (CMOS) technology. The time taken for a logic gate output to change after...
156
click to vote
VLSID
2004
IEEE
16 years 7 months ago
2004
IEEE
{A new low-power design method produces CMOS circuits that consume the least dynamic power at the highest speed permitted under the technology constraint. A gate is characterized b...
184
click to vote
VLSID
2001
IEEE
16 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
167
click to vote
HPCA
2007
IEEE
16 years 7 months ago
2007
IEEE
3D integration technology greatly increases transistor density while providing faster on-chip communication. 3D implementations of processors can simultaneously provide both laten...
166
click to vote
HPCA
2007
IEEE
16 years 7 months ago
2007
IEEE
Performance gains in memory have traditionally been obtained by increasing memory bus widths and speeds. The diminishing returns of such techniques have led to the proposal of an ...