5624 search results - page 125 / 1125 » On Conditional Covering Problem |
161
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DSN
2007
IEEE
16 years 20 days ago
2007
IEEE
Testing is a difficult process that becomes more difficult with scaling. With smaller and faster devices, tolerance for errors shrinks and devices may act correctly under certain ...
177
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ICSM
2000
IEEE
15 years 10 months ago
2000
IEEE
Conditioned slicing is a powerful generalisation of static and dynamic slicing which has applications to many problems in software maintenance and evolution, including re-use, ree...
135
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
– Identifying worst-case voltage drop conditions in every module supplied by the power grid is a crucial problem in modern IC design. In this paper we develop a novel methodology...
145
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ECAI
1992
Springer
15 years 10 months ago
1992
Springer
We consider non-Horn Deductive Data Bases (DDB) represented in a First Order language without function symbols. In this context the DDB is an incomplete description of the world. ...
184
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ALT
2008
Springer
15 years 8 months ago
2008
Springer
Abstract. We consider the problem of sequence prediction in a probabilistic setting. Let there be given a class C of stochastic processes (probability measures on the set of one-wa...