7195 search results - page 495 / 1439 » On Computing Power |
201
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DAC
2005
ACM
16 years 8 months ago
2005
ACM
Small, embedded integrated circuits (ICs) such as smart cards are vulnerable to so-called side-channel attacks (SCAs). The attacker can gain information by monitoring the power co...
170
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DAC
2006
ACM
16 years 8 months ago
2006
ACM
Increasing source voltage (Source-Biasing) is an efficient technique for reducing gate and sub-threshold leakage of SRAM arrays. However, due to process variation, a higher source...
175
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DAC
2006
ACM
16 years 8 months ago
2006
ACM
This paper describes an ultra low power active RFID tag and its automated design flow. RFID primitives to be supported by the tag are enumerated with RFID macros and the behavior ...
199
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
205
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SIGMOD
2003
ACM
16 years 7 months ago
2003
ACM
Modern database systems provide not only powerful data models but also complex query languages supporting powerful features such as the ability to create new database objects and ...