1721 search results - page 176 / 345 » On Active and Passive Testing |
165
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VTS
2007
IEEE
16 years 24 days ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
173
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DSD
2006
IEEE
16 years 17 days ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
173
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OOPSLA
2004
Springer
15 years 12 months ago
2004
Springer
Programmers tend to understand programs by thinking of concrete examples. Example Centric Programming seeks to add IDE support for examples throughout the process of programming. ...
181
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...
141
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CHI
2004
ACM
16 years 6 months ago
2004
ACM
Online communities can help people form productive relationships. Unfortunately, this potential is not always fulfilled: many communities fail, and designers don't have a sol...