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JSS
2007
105views more  JSS 2007»
15 years 6 months ago
Composing pattern-based components and verifying correctness
Designing large software systems out of reusable components has become increasingly popular. Although liberal composition of reusable components saves time and expense, many exper...
Jing Dong, Paulo S. C. Alencar, Donald D. Cowan, S...
GLVLSI
2002
IEEE
108views VLSI» more  GLVLSI 2002»
15 years 11 months ago
Protected IP-core test generation
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
Alessandro Fin, Franco Fummi
DAC
2008
ACM
16 years 7 months ago
Scan chain clustering for test power reduction
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
Christian G. Zoellin, Hans-Joachim Wunderlich, Jen...
DAC
2000
ACM
16 years 7 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
DAC
2003
ACM
16 years 7 months ago
Making cyclic circuits acyclic
Cyclic circuits that do not hold state or oscillate are often the most convenient representation for certain functions, such as arbiters, and can easily be produced inadvertently ...
Stephen A. Edwards