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DATE
2007
IEEE
84views Hardware» more  DATE 2007»
16 years 1 months ago
On test generation by input cube avoidance
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...
Irith Pomeranz, Sudhakar M. Reddy
GBRPR
2007
Springer
16 years 25 days ago
Grouping Using Factor Graphs: An Approach for Finding Text with a Camera Phone
Abstract. We introduce a new framework for feature grouping based on factor graphs, which are graphical models that encode interactions among arbitrary numbers of random variables....
Huiying Shen, James Coughlan
IESS
2007
Springer
110views Hardware» more  IESS 2007»
16 years 25 days ago
Run-Time efficient Feasibility Analysis of Uni-Processor Systems with Static Priorities
: The performance of feasibility tests is crucial in many applications. When using feasibility tests online only a limited amount of analysis time is available. Run-time efficiency...
Karsten Albers, Frank Bodmann, Frank Slomka
DATE
2005
IEEE
107views Hardware» more  DATE 2005»
16 years 9 days ago
On Statistical Timing Analysis with Inter- and Intra-Die Variations
In this paper, we highlight a fast, effective and practical statistical approach that deals with inter and intra-die variations in VLSI chips. Our methodology is applied to a numb...
Hratch Mangassarian, Mohab Anis
APPROX
2005
Springer
84views Algorithms» more  APPROX 2005»
16 years 6 days ago
The Tensor Product of Two Codes Is Not Necessarily Robustly Testable
There has been significant interest lately in the task of constructing codes that are testable with a small number of random probes. Ben-Sasson and Sudan show that the repeated te...
Paul Valiant