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164
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
Abstract— Gate leakage (direct tunneling current for sub65nm CMOS) can severely affect both the transient and steady state behaviors of CMOS circuits. In this paper we quantify t...
184
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ICCD
2002
IEEE
16 years 3 months ago
2002
IEEE
We represent switching activity in VLSI circuits using a graphical probabilistic model based on Cascaded Bayesian Networks (CBN’s). We develop an elegant method for maintaining ...
166
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ICCAD
2007
IEEE
16 years 3 months ago
2007
IEEE
— Determination of maximum operating frequencies (Fmax) during manufacturing test at different operating voltages is required to: (a) to ensure that, for a Dynamic Voltage and Fr...
169
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ICCAD
2001
IEEE
16 years 3 months ago
2001
IEEE
Efficient high level design tools that can map behavioral descriptions to FPGA architectures are one of the key requirements to fully leverage FPGA for high throughput computatio...
205
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ICCAD
2001
IEEE
16 years 3 months ago
2001
IEEE
— In this study we introduce NetBench, a benchmarking suite for network processors. NetBench contains a total of 9 applications that are representative of commercial applications...