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IOLTS
2008
IEEE
83views Hardware» more  IOLTS 2008»
16 years 24 days ago
Yield Improvement, Fault-Tolerance to the Rescue?
With the technology entering the nano dimension, manufacturing processes are less and less reliable, thus drastically impacting the yield. A possible solution to alleviate this pr...
Julien Vial, Alberto Bosio, Patrick Girard, Christ...
ICANN
2007
Springer
16 years 16 days ago
Boosting Unsupervised Competitive Learning Ensembles
Topology preserving mappings are great tools for data visualization and inspection in large datasets. This research presents a combination of several topology preserving mapping mo...
Emilio Corchado, Bruno Baruque, Hujun Yin
FDL
2006
IEEE
16 years 13 days ago
Randomized Simulation of Hybrid Systems For Circuit Validation
Abstract. The paper proposes a simulation-based method for validating analog and mixed-signal circuits, using the hybrid systems methodology. This method builds upon RRT (Rapidly-e...
Thao Dang, Tarik Nahhal
CDC
2009
IEEE
15 years 11 months ago
Synthesis of positive-real functions with low-complexity series-parallel networks
— The purpose of this paper is to continue to develop the recently introduced concept of a regular positivereal function and its application to the classification of lowcomplexi...
Jason Zheng Jiang, Malcolm C. Smith
ICPR
2000
IEEE
15 years 10 months ago
Multichannel Blind Deconvolution of the Short-Exposure Astronomical Images
In this paper we present a new multichannel blind deconvolution method based on so-called subspace technique that was originally proposed by Harikumar and Bresler. When at least t...
Filip Sroubek, Jan Flusser, Tomás Suk, Stan...