Sciweavers

853 search results - page 42 / 171
» New test approach for embedded applications
Sort
View
FDL
2005
IEEE
15 years 11 months ago
Meta Modelling of Embedded Systems using Active Databases
The development process of embedded systems is characterized by the cooperation of various domains: components of hardware and software have to be considered as well as components...
Dieter Monjau, Mathias Sporer
ASPDAC
1995
ACM
104views Hardware» more  ASPDAC 1995»
15 years 9 months ago
Power analysis of a 32-bit embedded microcontroller
A new approach for power analysis of microprocessorshas recently been proposed [1]. The idea is to look at the power consumption in a microprocessor from the point of view of the ...
Vivek Tiwari, Mike Tien-Chien Lee
COCOA
2007
Springer
16 years 8 days ago
A New Exact Algorithm for the Two-Sided Crossing Minimization Problem
The Two-Sided Crossing Minimization (TSCM) problem calls for minimizing the number of edge crossings of a bipartite graph where the two sets of vertices are drawn on two parallel l...
Lanbo Zheng, Christoph Buchheim
TSP
2008
144views more  TSP 2008»
15 years 6 months ago
A New Robust Variable Step-Size NLMS Algorithm
A new framework for designing robust adaptive filters is introduced. It is based on the optimization of a certain cost function subject to a time-dependent constraint on the norm o...
Leonardo Rey Vega, Hernan Rey, Jacob Benesty, Sara...
ICIP
2004
IEEE
16 years 7 months ago
Wavelet-based contourlet transform and its application to image coding
In this paper, we first propose a new family of geometrical image transforms that decompose images both radially and angularly. Our construction comprises two stages of filter ban...
Ramin Eslami, Hayder Radha