Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
Bart Vermeulen, Mohammad Zalfany Urfianto, Sandeep...
Abstract. The overhead of matching CHR rules is alleviated by constraint store indexing. Attributed variables provide an efficient means of indexing on logical variables. Existing ...
: In this paper, a new approach for leaf recognition using the result of segmentation of leaf’s skeleton based on the combination of wavelet transform (WT) and Gaussian interpola...
Abstract. Recent commercial virtual reality shows have become very demanding in terms of interactive credibility and visual realism. In an effort to push further the immersive qual...
This paper introduces thread integration, a new method of providing low-cost concurrency for microcontrollers and microprocessors. This post-pass compiler technology effectively i...