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ITC
2003
IEEE
146views Hardware» more  ITC 2003»
15 years 11 months ago
A New Approach for Low Power Scan Testing
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
Takaki Yoshida, Masafumi Watari
PTS
2007
106views Hardware» more  PTS 2007»
15 years 7 months ago
A New Method for Interoperability Test Generation
Interoperability testing aims at verifying the possibility for two or more components to communicate correctly while providing the foreseen services. In this paper, we describe a n...
Alexandra Desmoulin, César Viho
DISOPT
2006
110views more  DISOPT 2006»
15 years 6 months ago
New facets of the STS polytope generated from known facets of the ATS polytope
While it was known for a long time how to transform an asymmetric traveling salesman problem on the complete graph with n vertices into a symmetric traveling salesman problem on a...
Egon Balas, Robert Carr, Matteo Fischetti, Neil Si...
CORR
2010
Springer
146views Education» more  CORR 2010»
15 years 6 months ago
Adaptive Submodularity: A New Approach to Active Learning and Stochastic Optimization
Solving stochastic optimization problems under partial observability, where one needs to adaptively make decisions with uncertain outcomes, is a fundamental but notoriously diffic...
Daniel Golovin, Andreas Krause
FOCS
2005
IEEE
16 years 15 hour ago
How to Pay, Come What May: Approximation Algorithms for Demand-Robust Covering Problems
Robust optimization has traditionally focused on uncertainty in data and costs in optimization problems to formulate models whose solutions will be optimal in the worstcase among ...
Kedar Dhamdhere, Vineet Goyal, R. Ravi, Mohit Sing...