1501 search results - page 80 / 301 » New Directions on Agile Methods: A Comparative Analysis |
179
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FMCAD
2008
Springer
15 years 8 months ago
2008
Springer
Post-silicon debug is the problem of determining what's wrong when the fabricated chip of a new design behaves incorrectly. This problem now consumes over half of the overall ...
157
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ISSRE
2000
IEEE
15 years 10 months ago
2000
IEEE
Automated generation of test cases is a prerequisite for fast testing. Whereas the research has addressed the creation of individual test points, test trajectoiy generation has at...
158
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IMCSIT
2010
15 years 1 months ago
2010
The present paper is aimed to compare the efficiency of a new segmentation method with several existing approaches. The paper addresses the problem of image segmentation evaluation...
174
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KDD
2004
ACM
16 years 6 months ago
2004
ACM
In order to effectively use machine learning algorithms, e.g., neural networks, for the analysis of survival data, the correct treatment of censored data is crucial. The concordan...
147
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CTRSA
2009
Springer
16 years 1 months ago
2009
Springer
Abstract. Fault Analysis is a powerful cryptanalytic technique that enables to break cryptographic implementations embedded in portable devices more efficiently than any other tech...