Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
Jungsub Kim, Mary Jane Irwin, Narayanan Vijaykrish...
Inter-wire coupling is a major source of power consumption and delay faults for on-chip buses implemented in UDSM SoC Systems. Elimination or minimization of such faults is crucia...
In this paper, we present a simple analytical equation for capturing phase errors in 3-stage ring oscillators. The model, based on a simple but useful idealization of the ring osc...
An accurate and efficient stacking effect macro-model for leakage power in sub-100nm circuits is presented in this paper. Leakage power, including subthreshold leakage power and ga...
Shengqi Yang, Wayne Wolf, Narayanan Vijaykrishnan,...
We present a new design of an Embedded Speech Recognition System. It combines the aspects of both hardware and software design to implement a speaker dependent, isolated word, sma...