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SAC
2002
ACM
15 years 6 months ago
An evolutionary algorithm for reducing integrated-circuit test application time
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
ISQED
2005
IEEE
112views Hardware» more  ISQED 2005»
16 years 1 days ago
Two-Dimensional Layout Migration by Soft Constraint Satisfaction
Layout migration has re-emerged as an important task due to the increasing use of library hard intellectual properties. While recent advances of migration tools have accommodated ...
Qianying Tang, Jianwen Zhu
PE
2007
Springer
137views Optimization» more  PE 2007»
15 years 6 months ago
A prediction method for job runtimes on shared processors: Survey, statistical analysis and new avenues
Grid computing is an emerging technology by which huge numbers of processors over the world create a global source of processing power. Their collaboration makes it possible to pe...
Menno Dobber, Robert D. van der Mei, Ger Koole
ICIP
2005
IEEE
16 years 2 days ago
Accuracy estimation of a new omnidirectional 3D vision sensor
We present a computer vision system that associates omnidirectional vision with structured light with the aim of obtaining depth information for a 360 degrees field of view.The a...
Radu Orghidan, Joaquim Salvi, El Mustapha Mouaddib
ICIP
2006
IEEE
16 years 8 months ago
A New Contourlet Transform with Sharp Frequency Localization
The contourlet transform was proposed as a directional multiresolution image representation that can efficiently capture and represent singularities along smooth object boundaries...
Yue M. Lu, Minh N. Do