2887 search results - page 235 / 578 » Name Generation and Linearity |
161
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ISCAS
2007
IEEE
16 years 27 days ago
2007
IEEE
—A Built-In Self-Test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixedsignal systems, is...
190
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ISCAS
2005
IEEE
16 years 6 days ago
2005
IEEE
Modern System-on-Chip (SoC) environments are swamped in high frequency noise that is generated by RF and digital circuits and propagated onto supply rails through capacitive coupli...
161
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ISCAS
2005
IEEE
16 years 6 days ago
2005
IEEE
This work presents a cost-effective test structure that is applicable to built-in self-test of time-to-digital converters (TDCs). The proposed structure uses deterministic dynamic ...
165
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CHES
2004
Springer
16 years 11 hour ago
2004
Springer
TTS is a genre of multivariate digital signature schemes first proposed in 2002. Its public map is composed of two affine maps sandwiching a Tame Map, which is a map invertible t...
155
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ER
2004
Springer
16 years 5 hour ago
2004
Springer
Abstract. Recent developments in reification of ER schemata include automatic generation of webbased database administration systems [1,2]. These systems enforce the schema cardin...