2072 search results - page 58 / 415 » Multibook's test environment |
149
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...
159
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FMCO
2006
Springer
15 years 9 months ago
2006
Springer
Testing application behavior in the presence of I/O failures is extremely difficult. The resources used for testing usually work without failure. Failures typically cannot be initi...
220
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FORTEST
2008
15 years 7 months ago
2008
Abstract. This chapter presents principles and techniques for model-based blackbox conformance testing of real-time systems using the UPPAAL model-checking tool-suite. The basis fo...
149
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CEC
2005
IEEE
15 years 11 months ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
177
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. ...