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ITC
2003
IEEE
126views Hardware» more  ITC 2003»
16 years 4 days ago
Deformations of IC Structure in Test and Yield Learning
This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Tho...
SIBGRAPI
2003
IEEE
16 years 4 days ago
A Sketch-Based Collaborative Design System
We present a system for collaborative conceptual design that allows users potentially located in geographically distant areas to cooperate by sketching, exploring and modifying the...
Zhe Fan, Ma Chi, Manuel M. Oliveira
ERCIMDL
2003
Springer
109views Education» more  ERCIMDL 2003»
16 years 3 days ago
Clustering Top-Ranking Sentences for Information Access
Abstract. In this paper we propose the clustering of top-ranking sentences (TRS) for effective information access. Top-ranking sentences are selected by a query-biased sentence ex...
Anastasios Tombros, Joemon M. Jose, Ian Ruthven
ANSS
2002
IEEE
15 years 12 months ago
Scalability of Parallel Simulation Cloning
In previous work we presented an algorithm for cloning parallel simulations that enables multiple simulated execution paths to be explored simultaneously. The method is targeted f...
Maria Hybinette, Richard M. Fujimoto
MICCAI
2001
Springer
15 years 11 months ago
Segmentation of Single-Figure Objects by Deformable M-reps
This paper describes the basis and behavior of segmentation of single figures in 3D by deformable m-reps models. Results are given for the segmentation of kidneys from CT and of h...
Stephen M. Pizer, Sarang C. Joshi, P. Thomas Fletc...