15636 search results - page 308 / 3128 » Modelling by supersaturated designs |
205
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ISQED
2006
IEEE
16 years 22 days ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
159
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ISQED
2006
IEEE
16 years 22 days ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...
163
Voted
ETFA
2005
IEEE
16 years 10 days ago
2005
IEEE
In High Volume Manufacturing (HVM), system control is shared between automation and human workers. The social organisation of workers plays an important role in supporting human d...
193
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VLSID
2005
IEEE
16 years 9 days ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
206
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CASSIS
2005
Springer
16 years 8 days ago
2005
Springer
System software for deeply embedded devices has to cope with a broad variety of requirements and platforms, but especially with strict resource constraints. To compete against prop...