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DAC
2004
ACM
16 years 7 months ago
Statistical timing analysis based on a timing yield model
Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
Farid N. Najm, Noel Menezes
DAC
2006
ACM
16 years 16 days ago
SystemC transaction level models and RTL verification
This paper describes how systems companies are adopting SystemC transaction level models for system on chip design and verification, and how these transaction level models are bei...
Stuart Swan
DAC
2007
ACM
16 years 7 months ago
Width-dependent Statistical Leakage Modeling for Random Dopant Induced Threshold Voltage Shift
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
Jie Gu, Sachin S. Sapatnekar, Chris H. Kim
DAC
2001
ACM
16 years 7 months ago
A New Gate Delay Model for Simultaneous Switching and Its Applications
Liang-Chi Chen, Sandeep K. Gupta, Melvin A. Breuer
DAC
2003
ACM
16 years 7 months ago
SAT-based unbounded symbolic model checking
Hyeong-Ju Kang, In-Cheol Park