Starting from a model of the within-die systematic variations using principal components analysis, a model is proposed for estimation of the parametric yield, and is then applied ...
This paper describes how systems companies are adopting SystemC transaction level models for system on chip design and verification, and how these transaction level models are bei...
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...