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ISQED
2008
IEEE
103views Hardware» more  ISQED 2008»
16 years 1 months ago
Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation
Negative bias temperature instability (NBTI) is one of the primary limiters of reliability lifetime in nano-scale integrated circuits. NBTI manifests itself in a gradual increase ...
Bin Zhang, Michael Orshansky
233
Voted
SBACPAD
2008
IEEE
170views Hardware» more  SBACPAD 2008»
16 years 1 months ago
Using Analytical Models to Efficiently Explore Hardware Transactional Memory and Multi-Core Co-Design
Transactional memory is emerging as a parallel programming paradigm for multi-core processors. Despite the recent interest in transactional memory, there has been no study to char...
James Poe, Chang-Burm Cho, Tao Li
IMSCCS
2007
IEEE
16 years 1 months ago
Ensemble Subsurface Modeling Using Grid Computing Technology
Ensemble Kalman Filter (EnKF) uses a randomized ensemble of subsurface models for error and uncertainty estimation. However, the complexity of geological models and the requiremen...
Xin Li, Zhou Lei, Christopher D. White, Gabrielle ...
221
Voted
IROS
2007
IEEE
162views Robotics» more  IROS 2007»
16 years 1 months ago
Genetic MRF model optimization for real-time victim detection in search and rescue
— One primary goal in rescue robotics is to deploy a team of robots for coordinated victim search after a disaster. This requires robots to perform subtasks, such as victim detec...
Alexander Kleiner, Rainer Kümmerle
204
Voted
ISCAS
2007
IEEE
173views Hardware» more  ISCAS 2007»
16 years 1 months ago
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM
— Due to continuous technology scaling, the reduction of nodal capacitances and the lowering of power supply voltages result in an ever decreasing minimal charge capable of upset...
Riaz Naseer, Younes Boulghassoul, Jeff Draper, San...