11484 search results - page 503 / 2297 » Modeling in the Large and Modeling in the Small |
189
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ICIAR
2004
Springer
16 years 14 days ago
2004
Springer
Abstract. We present a method for automatic segmentation of grey-scale images, based on a recently introduced deformable model, the charged-particle model (CPM). The model is inspi...
178
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JSSPP
2004
Springer
16 years 13 days ago
2004
Springer
Abstract. In order to evaluate different scheduling strategies for parallel computers, simulations are often executed. As the scheduling quality highly depends on the workload tha...
212
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COMPSAC
2002
IEEE
16 years 1 days ago
2002
IEEE
Quality is a fundamental concept in software and information system development. It is also a complex and elusive concept. A large number of quality models have been developed for...
202
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COMPLEX
2009
Springer
15 years 11 months ago
2009
Springer
Creating ensembles of random but "realistic" topologies for complex systems is crucial for many tasks such as benchmark generation and algorithm analysis. In general, exp...
187
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WSC
2007
15 years 9 months ago
2007
Semiconductor wafer fabrication facilities (wafer fabs) are among the most complex production facilities. A large product variety, hundreds of processing steps per product, hundre...