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TIP
2008
139views more  TIP 2008»
15 years 6 months ago
Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy
Abstract--Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, t...
François Aguet, Dimitri Van De Ville, Micha...
APSEC
2000
IEEE
15 years 11 months ago
Fuzzy concepts and formal methods: some illustrative examples
It has been recognised that formal methods are useful as a modelling tool in requirements engineering. Specification languages such as Z permit the precise and unambiguous modell...
Chris Matthews, Paul A. Swatman
AMFG
2005
IEEE
217views Biometrics» more  AMFG 2005»
16 years 6 days ago
An Investigation of Model Bias in 3D Face Tracking
3D tracking of faces in video streams is a difficult problem that can be assisted with the use of a priori knowledge of the structure and appearance of the subject’s face at pred...
Douglas Fidaleo, Gérard G. Medioni, Pascal ...
ICSE
2003
IEEE-ACM
15 years 11 months ago
An Analysis of the Fault Correction Process in a Large-Scale SDL Production Model
Improvements in the software development process depend on our ability to collect and analyze data drawn from various phases of the development life cycle. Our design metrics rese...
Dolores M. Zage, Wayne M. Zage
ANOR
2008
106views more  ANOR 2008»
15 years 6 months ago
Application of multi-dimensional procurement auction in single-period inventory models
Procurement is one of the major activities in the Manufacturing Resource Planning (MRP II), which is closely coupled with inventory management. Any improvement in this area will h...
Pooya Farahvash, Tayfur Altiok