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ASPDAC
2008
ACM
78views Hardware» more  ASPDAC 2008»
15 years 8 months ago
Handling partial correlations in yield prediction
In nanometer regime, IC designs have to consider the impact of process variations, which is often indicated by manufacturing/parametric yield. This paper investigates a yield model...
Sridhar Varadan, Janet Meiling Wang, Jiang Hu
BPM
2006
Springer
160views Business» more  BPM 2006»
15 years 8 months ago
Analyzing Interacting BPEL Processes
Abstract. This paper addresses the problem of analyzing the interaction between BPEL processes. We present a technology chain that starts out with a BPEL process and transforms it ...
Niels Lohmann, Peter Massuthe, Christian Stahl, Da...
COMAD
2008
15 years 8 months ago
The Orion Uncertain Data Management System
Orion is a state-of-the-art uncertain database management system that extends the relational model to include probabilistic uncertain data as first call data types. This demonstra...
Sarvjeet Singh, Chris Mayfield, Sagar Mittal, Suni...
LREC
2008
141views Education» more  LREC 2008»
15 years 8 months ago
A Comparative Study on Language Identification Methods
In this paper we present two experiments conducted for comparison of different language identification algorithms. Short words-, frequent words- and n-gram-based approaches are co...
Lena Grothe, Ernesto William De Luca, Andreas N&uu...
ACL
2006
15 years 8 months ago
A Comparison of Document, Sentence, and Term Event Spaces
The trend in information retrieval systems is from document to sub-document retrieval, such as sentences in a summarization system and words or phrases in question-answering syste...
Catherine Blake