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ECMDAFA
2006
Springer
107views Hardware» more  ECMDAFA 2006»
15 years 10 months ago
Mutation Analysis Testing for Model Transformations
In MDE, model transformations should be efficiently tested so that it may be used and reused safely. Mutation analysis is an efficient technique to evaluate the quality of test dat...
Jean-Marie Mottu, Benoit Baudry, Yves Le Traon
ICDM
2008
IEEE
148views Data Mining» more  ICDM 2008»
16 years 1 months ago
Formal Models for Expert Finding on DBLP Bibliography Data
Finding relevant experts in a specific field is often crucial for consulting, both in industry and in academia. The aim of this paper is to address the expert-finding task in a...
Hongbo Deng, Irwin King, Michael R. Lyu
WSC
2004
15 years 8 months ago
Characterizations and Relationships of World Views
We describe a characterization the three classical world views of event scheduling, activity scanning, and process interaction and discuss transformations among them. We believe t...
C. Michael Overstreet, Richard E. Nance
CAD
2002
Springer
15 years 6 months ago
Integrating part and assembly modelling
Current modelling systems adequately support either modelling of parts or modelling of assemblies, whereas ideal modelling systems should adequately support both. To achieve this,...
Alex Noort, Geoffry F. M. Hoek, Willem F. Bronsvoo...
ICASSP
2009
IEEE
16 years 1 months ago
Multi-layer ratio Semi-Definite Classifiers
We develop a novel extension to the Ratio Semi-definite Classifier, a discriminative model formulated as a ratio of semi-definite polynomials. By adding a hidden layer to the m...
Jonathan Malkin, Jeff Bilmes
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