10458 search results - page 219 / 2092 » Modeling Features at Runtime |
179
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TCAD
2002
15 years 6 months ago
2002
Chemical-mechanical polishing (CMP) and other manufacturing steps in very deep submicron VLSI have varying effects on device and interconnect features, depending on local character...
147
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PPSN
2004
Springer
15 years 12 months ago
2004
Springer
Abstract. Exploiting the diversity of hypotheses produced by evolutionary learning, a new ensemble approach for Feature Selection is presented, aggregating the feature rankings ext...
207
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CSL
2007
Springer
15 years 6 months ago
2007
Springer
This paper describes the use of dynamic Bayesian networks for the task of articulatory feature recognition. We show that by modeling the dependencies between a set of 6 multi-leve...
121
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ICASSP
2010
IEEE
15 years 6 months ago
2010
IEEE
This paper summarizes recent work at Microsoft on the development of novel direct models. The key characteristic of our approaches is the use of long-span segment level features t...
172
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PRDC
2002
IEEE
15 years 11 months ago
2002
IEEE
Feature interaction is a kind of inconsistent conflict between multiple communication services and considered an obstacle to developing reliable telephony systems. In this paper ...