5239 search results - page 328 / 1048 » Model-Integrated Embedded Systems |
156
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DATE
2006
IEEE
16 years 24 days ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
207
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ISORC
2005
IEEE
16 years 9 days ago
2005
IEEE
As complexity of real-time embedded software grows, it is desirable to use formal verification techniques to achieve a high level of assurance. We discuss application of model-ch...
166
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HPDC
1999
IEEE
15 years 11 months ago
1999
IEEE
Advances in network technology continue to improve the communication performance of workstation and PC clusters, making high-performance workstation-clustercomputing increasingly ...
170
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DSN
2006
IEEE
15 years 10 months ago
2006
IEEE
Cyclic redundancy codes (CRCs) are widely used in network transmission and data storage applications because they provide better error detection than lighter weight checksum techn...
187
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HIPC
2000
Springer
15 years 10 months ago
2000
Springer
Embedded systems consisting of the application program ROM, RAM, the embedded processor core and any custom hardware on a single wafer are becoming increasingly common in areas suc...