1890 search results - page 146 / 378 » Model-Based Testing in Practice |
150
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VTS
2003
IEEE
15 years 11 months ago
2003
IEEE
Delay faults are an increasingly important test challenge. Traditional open and bridge fault models are incomplete because only the functional fault or a subset of delay fault are...
135
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ITC
2002
IEEE
15 years 11 months ago
2002
IEEE
—Logic optimization is the step of the very large scale integration (VLSI) design cycle where the designer performs modifications on a design to satisfy different constraints suc...
143
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SPAA
2000
ACM
15 years 10 months ago
2000
ACM
We conduct an experimental analysis of a distributed, randomized algorithm for edge coloring graphs. The algorithm is extremely simple, yet, according to the probabilistic analysi...
146
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
The functional validation of a state-of-the-art digital design is usually performed by simulation of a register-transfer-level model. The degree to which the testvector suite cove...
146
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CP
2008
Springer
15 years 8 months ago
2008
Springer
We present an incremental refinement algorithm for approximate compilation of constraint satisfaction models into multivalued decision diagrams (MDDs). The algorithm uses a vertex ...