Models are increasingly being relied upon to inform and support natural resource management. They are incorporating an ever broader range of disciplines and now often confront peo...
Anthony J. Jakeman, Rebecca A. Letcher, John P. No...
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
Raising seeds for biological experiments is prone to error; a careful experimenter will test in the lab to verify that plants are of the intended strain. Choosing a minimal set of...
To make qualified decisions when extrapolating results from a survey sample with imprecise tests requires careful handling of uncertainty. Both the imprecise test and uncertainty ...
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...