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DAC
2007
ACM
16 years 7 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
PPOPP
2010
ACM
16 years 3 months ago
GAMBIT: effective unit testing for concurrency libraries
As concurrent programming becomes prevalent, software providers are investing in concurrency libraries to improve programmer productivity. Concurrency libraries improve productivi...
Katherine E. Coons, Sebastian Burckhardt, Madanlal...
PEPM
2010
ACM
16 years 3 months ago
PET: a partial evaluation-based test case generation tool for Java bytecode
PET is a prototype Partial Evaluation-based Test case generation tool for a subset of Java bytecode programs. It performs white-box test generation by means of two consecutive Par...
Elvira Albert, Miguel Gómez-Zamalloa, Germ&...
QSIC
2009
IEEE
16 years 1 months ago
From UML Statecharts to LOTOS: A Semantics Preserving Model Transformation
—A well-founded testing theory encourages the practical application of test case generation techniques. This aims at overcoming the ever increasing complexity of softwareenabled ...
Valentin Chimisliu, Christian Schwarzl, Bernhard P...
ICCD
2008
IEEE
202views Hardware» more  ICCD 2008»
16 years 3 months ago
CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...