6431 search results - page 148 / 1287 » Model Building by Resolution |
175
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
163
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BMCBI
2007
15 years 6 months ago
2007
Background: Experimentally determined protein structures may contain errors and require validation. Conformational criteria based on the Ramachandran plot are mainly used to disti...
175
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ICIP
2009
IEEE
16 years 7 months ago
2009
IEEE
In recent years, statistically motivated approaches for the registration and tracking of non-rigid objects, such as the Active Appearance Model (AAM), have become very popular. A ...
176
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WWW
2007
ACM
16 years 7 months ago
2007
ACM
This paper presents a semantic portal, SEMPort, which provides better user support with personalized views, semantic navigation, ontology-based search and three different kinds of...
192
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HICSS
2009
IEEE
16 years 1 months ago
2009
IEEE
Manufacturing companies that are expanding their product offering to cover also lifecycle services in the customers’ facilities are facing the increasing complexity and risk to ...