2225 search results - page 130 / 445 » Mining Sequential Patterns |
195
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KDD
2004
ACM
16 years 6 months ago
2004
ACM
One fundamental challenge for mining recurring subgraphs from semi-structured data sets is the overwhelming abundance of such patterns. In large graph databases, the total number ...
143
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DSD
2007
IEEE
16 years 21 days ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
158
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DSD
2005
IEEE
15 years 12 months ago
2005
IEEE
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subta...
195
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KDD
2001
ACM
15 years 10 months ago
2001
ACM
Advances in image acquisition and storage technology have led to tremendous growth in significantly large and detailed image databases. These images, if analyzed, can reveal usefu...
153
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ISQED
2007
IEEE
16 years 19 days ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...