3974 search results - page 567 / 795 » Metric Functional Dependencies |
202
click to vote
IEEEPACT
2002
IEEE
15 years 11 months ago
2002
IEEE
Modern embedded systems often require high degrees of instruction-level parallelism (ILP) within strict constraints on power consumption and chip cost. Unfortunately, a high-perfo...
153
click to vote
ICCV
1999
IEEE
15 years 11 months ago
1999
IEEE
This paper considers the problem of self-calibration of a camera from an image sequence in the case where the camera's internal parameters (most notably focal length) may cha...
191
click to vote
MSS
1999
IEEE
15 years 11 months ago
1999
IEEE
Benchmark tests have been designed and conducted for the purpose of evaluating the use of automated tape libraries in on-line digital check image retrieval applications. This type...
173
click to vote
DATE
2010
IEEE
15 years 10 months ago
2010
IEEE
─ Error tolerance formally captures the notion that – for a wide variety of applications including audio, video, graphics, and wireless communications – a defective chip that...
199
click to vote
GECCO
2010
Springer
15 years 7 months ago
2010
Springer
Most highly accurate predictive modeling techniques produce opaque models. When comprehensible models are required, rule extraction is sometimes used to generate a transparent mod...