In the paper, an evolutionary approach to test generation for functional BIST is considered. The aim of the proposed scheme is to minimize the test data volume by allowing the dev...
Y. A. Skobtsov, D. E. Ivanov, V. Y. Skobtsov, Raim...
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
Fulvio Corno, Paolo Prinetto, Maurizio Rebaudengo,...
Background: Computational methods for problem solving need to interleave information access and algorithm execution in a problem-specific workflow. The structures of these workflo...
An important topic in face recognition as well as in video coding or multi-modal human machine interfaces is the automatic localization of faces or headand-shoulder regions in vis...
In the automatic design of custom instruction set processors, there can be a very large set of potential custom instructions, from which a few instructions are required to be chos...