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ICCAD
2010
IEEE
121views Hardware» more  ICCAD 2010»
15 years 4 months ago
Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation
In this paper, we propose a new technique, referred to as MultiWafer Virtual Probe (MVP) to efficiently model wafer-level spatial variations for nanoscale integrated circuits. Tow...
Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob...
ICCV
2009
IEEE
15 years 4 months ago
Non-iterative approach for fast and accurate vanishing point detection
We present an algorithm that quickly and accurately estimates vanishing points in images of man-made environments. Contrary to previously proposed solutions, ours is neither itera...
Jean-Philippe Tardif
IJDAR
2010
164views more  IJDAR 2010»
15 years 4 months ago
Distance-based classification of handwritten symbols
We study online classification of isolated handwritten symbols using distance measures on spaces of curves. We compare three distance-based measures on a vector space representatio...
Oleg Golubitsky, Stephen M. Watt
CDC
2010
IEEE
215views Control Systems» more  CDC 2010»
15 years 1 months ago
Consensus with robustness to outliers via distributed optimization
Over the past few years, a number of distributed algorithms have been developed for integrating the measurements acquired by a wireless sensor network. Among them, average consensu...
Jixin Li, Ehsan Elhamifar, I.-Jeng Wang, Ren&eacut...
NECO
2011
15 years 1 months ago
Least-Squares Independent Component Analysis
Accurately evaluating statistical independence among random variables is a key element of Independent Component Analysis (ICA). In this paper, we employ a squared-loss variant of ...
Taiji Suzuki, Masashi Sugiyama