In this work we propose a methodology to self-consistently solve leakage power with temperature to predict thermal runaway. We target 28nm FinFET based circuits as they are more p...
High power consumption not only leads to short battery life for handheld devices, but also causes on-chip thermal and reliability problems in general. As power consumption is prop...
Huaizhi Wu, I-Min Liu, Martin D. F. Wong, Yusu Wan...
Abstract—Interconnects (wires, buffers, clock distribution networks, multiplexers and busses) consume a significant fraction of total circuit power. In this work, we demonstrat...
We propose a novel trap-based architecture for enterprise networks that detects “silent” attackers who are eavesdropping network traffic. The primary contributions of our work...
Brian M. Bowen, Vasileios P. Kemerlis, Pratap V. P...
Aspect-Oriented Modeling (AOM) provides support for separating concerns at the design level. Even though most AOM approaches provide means to execute the composition of the modula...
Aram Hovsepyan, Riccardo Scandariato, Stefan Van B...