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DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
16 years 16 days ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
ICPP
2007
IEEE
16 years 15 days ago
RECN-IQ: A Cost-Effective Input-Queued Switch Architecture with Congestion Management
As the number of computing and storage nodes keeps increasing, the interconnection network is becoming a key element of many computing and communication systems, where the overall...
Gaspar Mora, Pedro Javier García, Jose Flic...
IBPRIA
2007
Springer
16 years 10 days ago
Optimally Discriminant Moments for Speckle Detection in Real B-Scan Images
Detection of speckle in ultrasound (US) images has been regarded as an important research topic in US imaging, mainly focusing on two specific applications: improving signal to no...
Robert Marti, Joan Martí, Jordi Freixenet, ...
ICFCA
2007
Springer
16 years 10 days ago
A Parameterized Algorithm for Exploring Concept Lattices
Kuznetsov shows that Formal Concept Analysis (FCA) is a natural framework for learning from positive and negative examples. Indeed, the results of learning from positive examples (...
Peggy Cellier, Sébastien Ferré, Oliv...
SAS
2007
Springer
108views Formal Methods» more  SAS 2007»
16 years 9 days ago
Programming Language Design and Analysis Motivated by Hardware Evolution
Abstract. Silicon chip design has passed a threshold whereby exponentially increasing transistor density (Moore’s Law) no longer translates into increased processing power for si...
Alan Mycroft