53302 search results - page 259 / 10661 » Meta-Design: Design for Designers |
124
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VLSID
2005
IEEE
16 years 6 months ago
2005
IEEE
The electromigration effect within current-density-stressed signal and power lines is an ubiquitous and increasingly important reliability and design problem in sub-micron IC desi...
175
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ETS
2000
IEEE
15 years 6 months ago
2000
IEEE
What is the nature of instructional design? Is instructional design merely the practical application of learning theories to learning situations? What elements form the building b...
192
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TVLSI
2002
15 years 6 months ago
2002
Although simulation remains an important part of application-specific integrated circuit (ASIC) validation, hardware-assisted parallel verification is becoming a larger part of the...
168
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MICRO
2010
IEEE
15 years 4 months ago
2010
IEEE
Soft error reliability is increasingly becoming a first-order design concern for microprocessors, as a result of higher transistor counts, shrinking device geometries and lowering ...
179
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ICCAD
2009
IEEE
15 years 4 months ago
2009
IEEE
Present application specific embedded systems tend to choose instruction set extensions (ISEs) based on limitations imposed by the available data bandwidth to custom functional un...