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ICSE
2005
IEEE-ACM
16 years 6 months ago
Continuous testing in eclipse
David Saff, Michael D. Ernst
ICSE
2007
IEEE-ACM
16 years 6 months ago
The Factory Pattern in API Design: A Usability Evaluation
Brian Ellis, Jeffrey Stylos, Brad A. Myers
ICSE
2007
IEEE-ACM
16 years 6 months ago
Self-Managed Systems: an Architectural Challenge
Jeff Kramer, Jeff Magee
ICSE
2007
IEEE-ACM
16 years 6 months ago
Reliability Analysis of Concurrent Systems Using LTSA
Genaína Nunes Rodrigues, David S. Rosenblum...