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DATE
2005
IEEE
104views Hardware» more  DATE 2005»
16 years 14 days ago
Defect Aware Test Patterns
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen W...
MABS
2004
Springer
16 years 6 days ago
Agent-Based Modelling of Forces in Crowds
Recent events have highlighted the importance of good models of crowds, however many existing crowd models are either computationally inefficient, or are missing a crucial human be...
Colin Marc Henein, Tony White
SC
2000
ACM
15 years 11 months ago
ESP: A System Utilization Benchmark
This article describes a new benchmark, called the Effective System Performance (ESP) test, which is designed to measure system-level performance, including such factors as job sc...
Adrian T. Wong, Leonid Oliker, William T. C. Krame...
EDBT
2009
ACM
106views Database» more  EDBT 2009»
15 years 10 months ago
AlphaSum: size-constrained table summarization using value lattices
Consider a scientist who wants to explore multiple data sets to select the relevant ones for further analysis. Since the visualization real estate may put a stringent constraint o...
K. Selçuk Candan, Huiping Cao, Yan Qi 0002,...
AUIC
2004
IEEE
15 years 10 months ago
Rapid Visual Flow: How Fast Is Too Fast?
It is becoming increasingly common for user interfaces to use zooming visual effects that automatically adapt to user actions. The MacOs X `dock' icon panel, for instance, us...
Andrew Wallace, Joshua Savage, Andy Cockburn