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DAC
2007
ACM
16 years 7 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
SAC
2006
ACM
16 years 14 days ago
Interval-based robust statistical techniques for non-negative convex functions, with application to timing analysis of computer
: In chip design, one of the main objectives is to decrease its clock cycle; however, the existing approaches to timing analysis under uncertainty are based on fundamentally restri...
Michael Orshansky, Wei-Shen Wang, Martine Ceberio,...
SIGMOD
2004
ACM
122views Database» more  SIGMOD 2004»
16 years 6 months ago
Adapting to Source Properties in Processing Data Integration Queries
An effective query optimizer finds a query plan that exploits the characteristics of the source data. In data integration, little is known in advance about sources' propertie...
Zachary G. Ives, Alon Y. Halevy, Daniel S. Weld
ICCS
2007
Springer
16 years 20 days ago
Data Assimilation in Multiscale Chemical Transport Models
In this paper we discuss variational data assimilation using the STEM atmospheric Chemical Transport Model. STEM is a multiscale model and can perform air quality simulations and p...
Lin Zhang, Adrian Sandu
HIS
2008
15 years 8 months ago
Artificial Data Sets Based on Knowledge Generators: Analysis of Learning Algorithms Efficiency
This paper proposes a methodology to generate artificial data sets to evaluate the behavior of machine learning techniques. The methodology relies in the definition of a domain an...
Joaquin Rios-Boutin, Albert Orriols-Puig, Josep Ma...