5510 search results - page 692 / 1102 » Mathematics |
165
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...
160
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ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
175
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ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
It has been widely recognized that the dynamic range information of an application can be exploited to reduce the datapath bitwidth of either processors or ASICs, and therefore th...
183
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ICCAD
2001
IEEE
16 years 3 months ago
2001
IEEE
Dynamic voltage scaling (DVS) is a technique that varies the supply voltage and clock frequency based on the computation load to provide desired performance with the minimal amoun...
177
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PLPV
2010
ACM
16 years 3 months ago
2010
ACM
This paper presents a resource typing framework for the Guru d-programming language, in which abstractions for various kinds of program resources can be defined. Implemented exam...