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177
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ICCD
2001
IEEE
16 years 3 months ago
2001
IEEE
We present a simulation-based semi-formal verification method for sequential circuits described at the registertransfer level. The method consists of an iterative loop where cove...
161
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
Abstract—On-chip power density and temperature are rising exponentially with decreasing feature sizes. This alarming trend calls for temperature management at every level of syst...
182
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
In a synchronous finite state machine (FSM), huge current peaks are often observed at the moment of state transition. Previous low power state encoding algorithms focus on the red...
157
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
Large-scale process fluctuations in nano-scale IC technologies suggest applying high-order (e.g., quadratic) response surface models to capture the circuit performance variations....
167
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ICCAD
2005
IEEE
16 years 3 months ago
2005
IEEE
— Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...